SA/SNZ TR IEC 61000.1.1:2025
Electromagnetic compatibility (EMC) – Part 1.1: General – Application and interpretation of fundamental definitions and terms
Standard describes and interprets various terms considered to be of basic importance to concepts and practical application in the design and evaluation of electromagnetically compatible equipment and systems.
In addition, attention is drawn to the distinction between electromagnetic compatibility (EMC) tests carried out in a standardized set-up and those carried out at other locations, for example at premises where a device, equipment or system is manufactured or at the location where a device, equipment or system is installed (in situ tests or measurements).
This document is identical with, and has been reproduced from IEC TR 61000-1-1:2023, Electromagnetic compatibility (EMC) – Part 1-1: General – Application and interpretation of fundamental definitions and terms.
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SA/SNZ TR IEC 61000.1.1:2025 Electromagnetic compatibility (EMC) General - Application and interpretation of fundamental definitions and terms
Preface
Section FOREWORD
Section INTRODUCTION
Section 1 Scope
Section 2 Normative references
Section 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
Section 4 The electromagnetic environment
4.1 General
4.2 Coupling between emitting and susceptible devices
Section 5 Application of EMC terms and definitions
5.1 General
5.2 Relation between various types of levels
5.2.1 Emissions and immunity level (and limit)
5.2.2 Compatibility level
5.2.3 Examples to illustrate the concepts of using levels and limits
5.3 Probability aspects and margins
5.3.1 Compatibility levels and uncertainties
5.3.2 Standardized test
5.3.3 In situ test – Superposition
5.3.4 Lack of data
Section 6 Models and their limitations
6.1 General
6.2 Source models
6.2.1 Conducted emissions
6.2.2 Radiated emissions
6.3 Coupling models
6.3.1 General
6.3.2 Common impedance coupling
6.3.3 Coupling by induction
6.3.4 Radiative coupling
6.4 Susceptible device models
Figure 1 — Coupling paths between emitting and susceptible devices
Figure 2 — Limits and levels for a single emitter and susceptible device as a function of some independent variable (e.g., frequency)
Figure 3 — Emission/immunity limits and compatibility levels, with an example of emission/immunity levels for a single emitter and susceptible device as a function of some independent variable (e.g., frequency)
Figure 4 — Compatibility levels Uc for the odd harmonics in a public low-voltage network and examples of associated emission and immunity limits
Figure 5 — Limits, compatibility levels and margins, as a function of any independent variable (e.g., frequency)
Figure 6 — Example of the probability densities for an emission level and an immunity level, at one single value of the independent variable
Figure 7 — Example of superposition of disturbances
Figure 8 — Example of probability densities for an ultimate disturbance level (the sum of disturbance levels produced by various emitters) and the immunity levels of two types of susceptible device
Figure 9 — Source model for conducted emissions (source loaded by ZL1 and ZL2)
Figure 10 — Electric and magnetic dipole elements
Figure 11 — Capacitance per unit length as a function of conductor separation
Figure 12 — Flux density from parallel conductors
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SA/SNZ TR IEC 61000.1.1:2025 Electromagnetic compatibility (EMC) General - Application and interpretation of fundamental definitions and terms
Preface
Section FOREWORD
Section INTRODUCTION
Section 1 Scope
Section 2 Normative references
Section 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
Section 4 The electromagnetic environment
4.1 General
4.2 Coupling between emitting and susceptible devices
Section 5 Application of EMC terms and definitions
5.1 General
5.2 Relation between various types of levels
5.2.1 Emissions and immunity level (and limit)
5.2.2 Compatibility level
5.2.3 Examples to illustrate the concepts of using levels and limits
5.3 Probability aspects and margins
5.3.1 Compatibility levels and uncertainties
5.3.2 Standardized test
5.3.3 In situ test – Superposition
5.3.4 Lack of data
Section 6 Models and their limitations
6.1 General
6.2 Source models
6.2.1 Conducted emissions
6.2.2 Radiated emissions
6.3 Coupling models
6.3.1 General
6.3.2 Common impedance coupling
6.3.3 Coupling by induction
6.3.4 Radiative coupling
6.4 Susceptible device models
Figure 1 — Coupling paths between emitting and susceptible devices
Figure 2 — Limits and levels for a single emitter and susceptible device as a function of some independent variable (e.g., frequency)
Figure 3 — Emission/immunity limits and compatibility levels, with an example of emission/immunity levels for a single emitter and susceptible device as a function of some independent variable (e.g., frequency)
Figure 4 — Compatibility levels Uc for the odd harmonics in a public low-voltage network and examples of associated emission and immunity limits
Figure 5 — Limits, compatibility levels and margins, as a function of any independent variable (e.g., frequency)
Figure 6 — Example of the probability densities for an emission level and an immunity level, at one single value of the independent variable
Figure 7 — Example of superposition of disturbances
Figure 8 — Example of probability densities for an ultimate disturbance level (the sum of disturbance levels produced by various emitters) and the immunity levels of two types of susceptible device
Figure 9 — Source model for conducted emissions (source loaded by ZL1 and ZL2)
Figure 10 — Electric and magnetic dipole elements
Figure 11 — Capacitance per unit length as a function of conductor separation
Figure 12 — Flux density from parallel conductors
Previous versions
SA/SNZ TR IEC 61000.1.1:2025
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