ISO/TS 21356-1:2021
Nanotechnologies — Structural characterization of graphene — Part 1: Graphene from powders and dispersions
This document specifies the sequence of methods for characterizing the structural properties of graphene, bilayer graphene and graphene nanoplatelets from powders and liquid dispersions using a range of measurement techniques typically after the isolation of individual flakes on a substrate. The properties covered are the number of layers/thickness, the lateral flake size, the level of disorder, layer alignment and the specific surface area. Suggested measurement protocols, sample preparation routines and data analysis for the characterization of graphene from powders and dispersions are given.
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Sequence of measurement methods
6 Rapid test for graphitic material using Raman spectroscopy
7 Preparing a liquid dispersion
7.1 General
7.2 Preparing a dispersion of the correct concentration
7.2.1 Powder samples
7.2.2 Samples already in a dispersion
8 Determination of methods
9 Structural characterization using optical microscopy, SEM, AFM and Raman spectroscopy
10 Structural characterization using TEM
11 Surface area determination using the BET method
12 Graphene lateral size and number fraction calculation
Annex A (informative) Rapid test for graphitic material using Raman spectroscopy
Annex B (informative) Structural characterization protocol using SEM, AFM and Raman spectroscopy
Annex C (informative) Structural characterization using TEM
Annex D (informative) Lateral size and number fraction calculation
Annex E (informative) Brunauer–Emmett–Teller method
Annex F (informative) Additional sample preparation protocols — Silicon dioxide on silicon wafer preparation and cleaning
Bibliography
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Sequence of measurement methods
6 Rapid test for graphitic material using Raman spectroscopy
7 Preparing a liquid dispersion
7.1 General
7.2 Preparing a dispersion of the correct concentration
7.2.1 Powder samples
7.2.2 Samples already in a dispersion
8 Determination of methods
9 Structural characterization using optical microscopy, SEM, AFM and Raman spectroscopy
10 Structural characterization using TEM
11 Surface area determination using the BET method
12 Graphene lateral size and number fraction calculation
Annex A (informative) Rapid test for graphitic material using Raman spectroscopy
Annex B (informative) Structural characterization protocol using SEM, AFM and Raman spectroscopy
Annex C (informative) Structural characterization using TEM
Annex D (informative) Lateral size and number fraction calculation
Annex E (informative) Brunauer–Emmett–Teller method
Annex F (informative) Additional sample preparation protocols — Silicon dioxide on silicon wafer preparation and cleaning
Bibliography