ISO/IEC TR 29158:2011
Information technology — Automatic identification and data capture techniques — Direct Part Mark (DPM) Quality Guideline
ISO/IEC TR 29158:2011 is an engineering document intended for verifier manufacturers and application specification developers.
It describes modifications which are to be considered in conjunction with the symbol quality methodology defined in ISO/IEC 15415 and a symbology specification. It defines alternative illumination conditions, some new terms and parameters, modifications to the measurement and grading of certain parameters, and the reporting of the grading results.
ISO/IEC TR 29158:2011 was developed to assess the symbol quality of direct marked parts, where the mark is applied directly to the surface of the item and the reading device is a two-dimensional imager.
When application specifications allow, this method may also be applied to symbols produced by other methods. This is appropriate when direct part marked (DPM) symbols and non-DPM symbols are being scanned in the same scanning environment. The symbol grade is reported as a DPM grade rather than as an ISO/IEC 15415 grade.
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1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Overview of methodology
5.1 Process differences from 15415
5.2 Lighting
6 Obtaining the image
6.1 Orientation of the symbol to the camera
6.1.1 Camera position
6.1.2 Orienting the symbol
6.2 Lighting
6.2.1 Diffuse perpendicular (on-axis/bright field) (90)
6.2.2 Diffuse off-axis (D)
6.2.3 Low angle, four direction (30Q)
6.2.4 Low angle, two direction (30T)
6.2.5 Low angle, one direction (30S)
6.3 Image focus
6.4 Reflectance calibration
6.5 Initial image reflectance level of the symbol under test
6.5.1 Initialize aperture size
6.5.2 Create initial histogram of symbol under test
6.5.3 Compute mean
6.5.4 Optimize image
7 Obtaining the test image
7.1 Binarize image
7.2 Apply Reference Decode Algorithm
7.3 Connect areas of the same colour
7.3.1 Initializing stick size and module colour
7.3.2 Connect like colours
7.3.3 Apply the Reference Decode Algorithm
7.3.4 Repeat if necessary
7.3.5 Continue until end
7.4 Final image adjustment
7.4.1 Determine grid-point reflectance with two apertures
7.4.2 Create a grid-point histogram
7.4.3 Measure MeanLight
7.4.4 Record parameters
7.4.5 Create binarized images for the Symbology Reference Decode
7.4.6 Decode
8 Determine contrast parameters
8.1 Calculate Cell Contrast (CC)
8.2 Calculate Cell Modulation (CM)
8.3 Calculate % Reflectance of Symbol (Rtarget)
9 Grading
9.1 Cell Contrast (CC)
9.2 Minimum Reflectance
9.3 Cell Modulation (CM)
9.4 Fixed pattern damage
9.5 Final grade
10 Communicating grade requirements and results
10.1 Communication from Application to Verifier
10.2 Communicating from Verifier to Application
10.3 Communicating Lighting
10.3.1 Low angle lighting
10.3.2 High-angle lighting
10.3.3 Lighting orientation grade
10.3.4 Lighting angle grade
10.4 Communicating the use of a proprietary decode
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1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Overview of methodology
5.1 Process differences from 15415
5.2 Lighting
6 Obtaining the image
6.1 Orientation of the symbol to the camera
6.1.1 Camera position
6.1.2 Orienting the symbol
6.2 Lighting
6.2.1 Diffuse perpendicular (on-axis/bright field) (90)
6.2.2 Diffuse off-axis (D)
6.2.3 Low angle, four direction (30Q)
6.2.4 Low angle, two direction (30T)
6.2.5 Low angle, one direction (30S)
6.3 Image focus
6.4 Reflectance calibration
6.5 Initial image reflectance level of the symbol under test
6.5.1 Initialize aperture size
6.5.2 Create initial histogram of symbol under test
6.5.3 Compute mean
6.5.4 Optimize image
7 Obtaining the test image
7.1 Binarize image
7.2 Apply Reference Decode Algorithm
7.3 Connect areas of the same colour
7.3.1 Initializing stick size and module colour
7.3.2 Connect like colours
7.3.3 Apply the Reference Decode Algorithm
7.3.4 Repeat if necessary
7.3.5 Continue until end
7.4 Final image adjustment
7.4.1 Determine grid-point reflectance with two apertures
7.4.2 Create a grid-point histogram
7.4.3 Measure MeanLight
7.4.4 Record parameters
7.4.5 Create binarized images for the Symbology Reference Decode
7.4.6 Decode
8 Determine contrast parameters
8.1 Calculate Cell Contrast (CC)
8.2 Calculate Cell Modulation (CM)
8.3 Calculate % Reflectance of Symbol (Rtarget)
9 Grading
9.1 Cell Contrast (CC)
9.2 Minimum Reflectance
9.3 Cell Modulation (CM)
9.4 Fixed pattern damage
9.5 Final grade
10 Communicating grade requirements and results
10.1 Communication from Application to Verifier
10.2 Communicating from Verifier to Application
10.3 Communicating Lighting
10.3.1 Low angle lighting
10.3.2 High-angle lighting
10.3.3 Lighting orientation grade
10.3.4 Lighting angle grade
10.4 Communicating the use of a proprietary decode