ISO/IEC 18047-6:2017
Information technology — Radio frequency identification device conformance test methods — Part 6: Test methods for air interface communications at 860 MHz to 960 MHz
ISO/IEC 18047-6 defines test methods for determining the conformance of radio frequency identification (RFID) devices (tags and interrogators) for item management with the specifications given in ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64, but does not apply to the testing of conformity with regulatory or similar requirements.
The test methods require only that the mandatory functions, and any optional functions which are implemented, are verified. This can, in appropriate circumstances, be supplemented by further, application-specific functionality criteria that are not available in the general case.
The interrogator and tag conformance parameters in ISO/IEC 18047-6 are the following:
- type-specific conformance parameters including nominal values and tolerances;
- parameters that apply directly affecting system functionality and inter-operability.
Parameters that are already included in regulatory test requirements are not included in ISO/IEC 18047-6.
Unless otherwise specified, the tests in ISO/IEC 18047-6 are intended to be applied exclusively to RFID tags and interrogators defined in ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64.
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$429.00 NZD
|
|
| HardCopy |
$473.00 NZD
|
|
| Networkable PDF |
Price varies
|
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
4 Default conditions applicable to the test methods
4.1 Test environment
4.2 Pre-conditioning
4.2.1 General
4.2.2 Default tolerance
4.2.3 Noise floor at test location
4.2.4 Total measurement uncertainty
5 Setup of test equipment
5.1 Setup of test equipment for interrogator tests
5.1.1 General
5.1.2 Sense antenna
5.1.3 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-63 interrogator
5.2 Setup of test equipment for tag tests
5.2.1 General
5.2.2 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64 tags
6 Conformance tests for ISO/IEC 18000-61
6.1 Functional tests of interrogator
6.1.1 Interrogator modulation test
6.1.2 Interrogator demodulation and turn-around time
6.2 Functional tests of tag
6.2.1 Tag demodulation and turn-around time
6.2.2 Tag backscatter
6.2.3 Tag response time
6.2.4 Tag bit rate
6.2.5 Tag state storage time
7 Conformance tests for ISO/IEC 18000-62
7.1 Functional tests of interrogator
7.1.1 Interrogator modulation test
7.1.2 Interrogator demodulation and turn-around time
7.2 Functional tests of tag
7.2.1 Tag demodulation and turn-around time
7.2.2 Tag backscatter
7.2.3 Tag response time
7.2.4 Tag bit rate
7.2.5 Tag state storage time
8 Conformance tests for ISO/IEC 18000-63
8.1 Functional tests of interrogator
8.1.1 Interrogator data encoding
8.1.2 Interrogator RF envelope parameters
8.1.3 Interrogator RF power-up and power-down parameters
8.1.4 Interrogator preamble parameters
8.1.5 Interrogator link timing T2
8.1.6 Interrogator link timing T3
8.1.7 Interrogator link timing T4
8.2 Functional tests of tag
8.2.1 Tag frequency range
8.2.2 Tag demodulation capability
8.2.3 Tag duty cycle
8.2.4 Tag preamble
8.2.5 Tag link frequency tolerance and variation
8.2.6 Tag link timing T1
8.2.7 Tag link timing T2
8.2.8 Tag link timing T5
8.2.9 Tag link timing T6
8.2.10 Tag link timing T7
8.2.11 Tag state diagram
8.2.12 Tag backscatter (optional)
8.3 Additional protocol related tests
8.3.1 Memory overruns
8.3.2 Kill command
8.3.3 Unauthorized Write command
8.3.4 Optional commands and features
9 Conformance tests for ISO/IEC 18000-64
9.1 Functional tests of interrogator
9.1.1 Interrogator modulation test
9.1.2 Interrogator demodulation and data decoding
9.2 Functional tests of tag
9.2.1 General
9.2.2 Data encoding
9.2.3 Link bits
9.2.4 Tag timing parameters
9.2.5 Tag bit rate
9.2.6 Tag multi-page timing
9.2.7 Tag LBT
10 Conformance tests for ISO/IEC 18000-63 battery-assisted passive (BAP)
10.1 Tag functional tests
10.1.1 Battery-assisted passive tag persistence time test
11 Conformance tests for ISO/IEC 18000-63 Manchester mode battery-assisted passive (BAP)
11.1 Functional tests of interrogator
11.1.1 Interrogator RF envelope parameters
11.1.2 Interrogator activation minimum dwell time, TA
11.1.3 Interrogator link timing T2
11.1.4 Interrogator link timing T3
11.1.5 Interrogator link timing T4
11.2 Functional tests of tag
11.2.1 Tag demodulation capability
11.2.2 Tag link frequency tolerance and variation
11.2.3 Tag link timing T1
11.2.4 Tag link timing T2
11.2.5 Tag activation time maximum, TA
11.2.6 Tag stateful hibernate timer
12 Conformance tests for ISO/IEC 18000-63 Sensor support
12.1 Tag functional tests
12.1.1 Simple sensor test
13 Full-function sensor test
13.1 Purpose
13.2 Procedure
13.2.1 General
Annex A (informative) Test measurement site
Annex B (normative) Command coding for conformance tests for the different types of ISO/IEC 18000-6
Annex C (normative) Technical performance of the generic electronic test instruments
Annex D (normative) Tag emulator
Annex E (informative) Measurement examples
Bibliography
Previous versions
Keep me up-to-date
Sign up to receive updates when there are changes to this standard
Related Information
Similar Standards
-
AS/NZS ISO 28560.1:2023
Information and documentation – RFID in libraries, Part 1: Data elements and general guidelines for implementation
-
AS/NZS ISO 28560.2:2023
Information and documentation - RFID in libraries, Part 2: Encoding of RFID data elements based on rules from ISO/IEC 15962
-
BS 5464-1:1977
Optical character recognition, Character set OCR-A. Shapes and dimensions of the printed image
-
BS 5464-3:1983
Optical character recognition, Method of coding machine readable characters (MICR and OCR) for information processing
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
4 Default conditions applicable to the test methods
4.1 Test environment
4.2 Pre-conditioning
4.2.1 General
4.2.2 Default tolerance
4.2.3 Noise floor at test location
4.2.4 Total measurement uncertainty
5 Setup of test equipment
5.1 Setup of test equipment for interrogator tests
5.1.1 General
5.1.2 Sense antenna
5.1.3 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-63 interrogator
5.2 Setup of test equipment for tag tests
5.2.1 General
5.2.2 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64 tags
6 Conformance tests for ISO/IEC 18000-61
6.1 Functional tests of interrogator
6.1.1 Interrogator modulation test
6.1.2 Interrogator demodulation and turn-around time
6.2 Functional tests of tag
6.2.1 Tag demodulation and turn-around time
6.2.2 Tag backscatter
6.2.3 Tag response time
6.2.4 Tag bit rate
6.2.5 Tag state storage time
7 Conformance tests for ISO/IEC 18000-62
7.1 Functional tests of interrogator
7.1.1 Interrogator modulation test
7.1.2 Interrogator demodulation and turn-around time
7.2 Functional tests of tag
7.2.1 Tag demodulation and turn-around time
7.2.2 Tag backscatter
7.2.3 Tag response time
7.2.4 Tag bit rate
7.2.5 Tag state storage time
8 Conformance tests for ISO/IEC 18000-63
8.1 Functional tests of interrogator
8.1.1 Interrogator data encoding
8.1.2 Interrogator RF envelope parameters
8.1.3 Interrogator RF power-up and power-down parameters
8.1.4 Interrogator preamble parameters
8.1.5 Interrogator link timing T2
8.1.6 Interrogator link timing T3
8.1.7 Interrogator link timing T4
8.2 Functional tests of tag
8.2.1 Tag frequency range
8.2.2 Tag demodulation capability
8.2.3 Tag duty cycle
8.2.4 Tag preamble
8.2.5 Tag link frequency tolerance and variation
8.2.6 Tag link timing T1
8.2.7 Tag link timing T2
8.2.8 Tag link timing T5
8.2.9 Tag link timing T6
8.2.10 Tag link timing T7
8.2.11 Tag state diagram
8.2.12 Tag backscatter (optional)
8.3 Additional protocol related tests
8.3.1 Memory overruns
8.3.2 Kill command
8.3.3 Unauthorized Write command
8.3.4 Optional commands and features
9 Conformance tests for ISO/IEC 18000-64
9.1 Functional tests of interrogator
9.1.1 Interrogator modulation test
9.1.2 Interrogator demodulation and data decoding
9.2 Functional tests of tag
9.2.1 General
9.2.2 Data encoding
9.2.3 Link bits
9.2.4 Tag timing parameters
9.2.5 Tag bit rate
9.2.6 Tag multi-page timing
9.2.7 Tag LBT
10 Conformance tests for ISO/IEC 18000-63 battery-assisted passive (BAP)
10.1 Tag functional tests
10.1.1 Battery-assisted passive tag persistence time test
11 Conformance tests for ISO/IEC 18000-63 Manchester mode battery-assisted passive (BAP)
11.1 Functional tests of interrogator
11.1.1 Interrogator RF envelope parameters
11.1.2 Interrogator activation minimum dwell time, TA
11.1.3 Interrogator link timing T2
11.1.4 Interrogator link timing T3
11.1.5 Interrogator link timing T4
11.2 Functional tests of tag
11.2.1 Tag demodulation capability
11.2.2 Tag link frequency tolerance and variation
11.2.3 Tag link timing T1
11.2.4 Tag link timing T2
11.2.5 Tag activation time maximum, TA
11.2.6 Tag stateful hibernate timer
12 Conformance tests for ISO/IEC 18000-63 Sensor support
12.1 Tag functional tests
12.1.1 Simple sensor test
13 Full-function sensor test
13.1 Purpose
13.2 Procedure
13.2.1 General
Annex A (informative) Test measurement site
Annex B (normative) Command coding for conformance tests for the different types of ISO/IEC 18000-6
Annex C (normative) Technical performance of the generic electronic test instruments
Annex D (normative) Tag emulator
Annex E (informative) Measurement examples
Bibliography