Skip to main content

IEC 62562:2010

Current Date published:

Cavity resonator method to measure the complex permittivity of low-loss dielectric plates

IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version.

This publication contains colours which are considered to be useful for the correct understanding of its contents.

Get this standard Prices exclude GST
PDF ( Single user document)
$213.04 NZD
PDF ( Single user document)
$0.00 NZD
HardCopy
$251.30 NZD
Networkable PDF
Price varies
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 20

Keep me up-to-date

Sign up to receive updates when there are changes to this standard

Related Information

Similar Standards

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 20

IEC 62562:2010

Get this standard Prices exclude GST
PDF ( Single user document)
$213.04 NZD
PDF ( Single user document)
$0.00 NZD
HardCopy
$251.30 NZD
Networkable PDF
Price varies

Request to add this standard to your subscription

IEC 62562:2010

Price varies
Online library subscription

Your organisation’s Account Administrator must approve a request to add a standard to your subscription.

You may add a comment to the administrator below.

Cancel