IEC 62047-50:2025
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Date published:
Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.
This document applies to MEMS capacitive microphones.
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IEC 62047-50:2025
Get this standard
Prices exclude GST
PDF
( Single user document)
$181.00 NZD
HardCopy
$196.00 NZD
Networkable PDF
Price varies