IEC 62047-50:2025
Current Date published:
Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.
This document applies to MEMS capacitive microphones.
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$181.00 NZD | |
| HardCopy |
$196.00 NZD | |
| Networkable PDF |
Price varies
|
Pages: 13
Keep me up-to-date
Sign up to receive updates when there are changes to this standard
Related Information
Similar Standards
- BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
- BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
- BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors, Self-commutated semiconductor converters including direct d.c. converters
- BS EN 60464-2:2001
Varnishes used for electrical insulation, Methods of test
Pages: 13