IEC 61967-8:2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$213.04 NZD
|
|
| HardCopy |
$251.30 NZD
|
|
| Networkable PDF |
Price varies
|
Keep me up-to-date
Sign up to receive updates when there are changes to this standard
Related Information
Similar Standards
-
BS 6493-2.3:1987
Semiconductor devices. Integrated circuits, Recommendations for analogue integrated circuits
-
BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
-
BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
-
BS CECC 63101:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits