IEC 60747-5-14:2022
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$278.26 NZD
|
|
| HardCopy |
$316.52 NZD
|
|
| Networkable PDF |
Price varies
|
Keep me up-to-date
Sign up to receive updates when there are changes to this standard
Related Information
Similar Standards
-
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
-
BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
-
BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors, Self-commutated semiconductor converters including direct d.c. converters
-
BS EN 60464-2:2001
Varnishes used for electrical insulation, Methods of test