DD ENV 50219:1996
Withdrawn
Date published:
Description of the reliability test structures of the European mini test chip
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$463.54 NZD
|
|
| HardCopy |
$463.54 NZD
|
|
Related Information
31.200 Integrated circuits. Microelectronics
Similar Standards
-
BS 6493-2.3:1987
Semiconductor devices. Integrated circuits, Recommendations for analogue integrated circuits
-
BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
-
BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
-
BS CECC 63101:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
DD ENV 50219:1996
Get this standard
Prices exclude GST
PDF
( Single user document)
$463.54 NZD
HardCopy
$463.54 NZD