Skip to main content

DD ENV 50219:1996

Withdrawn Date published:

Warning: Withdrawn Standard. This document has been withdrawn without replacement. You may wish to search for a more up to date equivalent.

Description of the reliability test structures of the European mini test chip

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

Get this standard Prices exclude GST
PDF ( Single user document)
$449.55 NZD
HardCopy
$449.55 NZD
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 38

Related Information

Similar Standards

  • BS 6493-2.3:1987

    Semiconductor devices. Integrated circuits, Recommendations for analogue integrated circuits

  • BS CECC 63000:1990

    Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits

  • BS CECC 63100:1985

    Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits

  • BS CECC 63101:1985

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 38

DD ENV 50219:1996

Get this standard Prices exclude GST
PDF ( Single user document)
$449.55 NZD
HardCopy
$449.55 NZD

Request to add this standard to your subscription

DD ENV 50219:1996

Price varies
Online library subscription

Click "Send request for subscription" to request for your Account Administrator to add this standard to your subscripiton.

Comment

Cancel