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DD ENV 50219:1996

Withdrawn Date published:

Warning: Withdrawn Standard. This document has been withdrawn without replacement. You may wish to search for a more up to date equivalent.

Description of the reliability test structures of the European mini test chip

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

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Pages: 38

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Pages: 38

DD ENV 50219:1996

Get this standard Prices exclude GST
PDF ( Single user document)
$498.26 NZD
PDF ( Single user document)
$463.54 NZD
HardCopy
$539.13 NZD

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