ISO 17987-7:2016
Road vehicles — Local Interconnect Network (LIN) — Part 7: Electrical Physical Layer (EPL) conformance test specification
ISO 17987-7:2016 specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987‑4.
The purpose of ISO 17987-7:2016 is to provide a standardized way to verify whether a LIN bus driver is compliant to ISO 17987?4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different sources in a system environment.
ISO 17987-7:2016 provides all the necessary technical information to ensure that test results are consistent even on different test systems, provided that the particular test suite and the test system are compliant to the content of this document.
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
3.2 Symbols
3.3 Abbreviated terms
4 Conventions
5 EPL 12 V LIN devices with RX and TX access
5.1 Test specification overview
5.1.1 Test case organization
5.1.2 Measurement and signal generation requirements
5.2 Operational conditions — Calibration
5.2.1 Electrical input/output, LIN protocol
5.2.2 [EPL–CT 1] Operating voltage range
5.2.3 Threshold voltages
5.2.4 [EPL–CT 5] Variation of VSUP_NON_OP
5.2.5 IBUS under several conditions
5.2.6 Slope control
5.2.7 Propagation delay
5.2.8 Supply voltage offset
5.2.9 Failure
5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference — IUT as slave
5.3 Operation mode termination
5.3.1 General
5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as slave
5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as master
5.4 Static test cases
6 EPL 12 V LIN devices without RX and TX access
6.1 Test specification overview
6.2 Communication scheme
6.2.1 General
6.2.2 IUT as slave
6.2.3 IUT as master
6.2.4 IUT class C device
6.3 Test case organization
6.4 Measurement and signal generation — Requirements
6.4.1 Data generation
6.4.2 Various requirements
6.5 Operational conditions — Calibration
6.5.1 Electrical input/output, LIN protocol
6.5.2 [EPL–CT 25] Operating voltage range
6.5.3 Threshold voltages
6.5.4 [EPL–CT 29] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 40 V]
6.5.5 IBUS under several conditions
6.5.6 Slope control
6.5.7 [EPL–CT 35] Propagation delay
6.5.8 Supply voltage offset
6.5.9 Failure
6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference — IUT as slave
6.6 Operation mode termination
6.6.1 General
6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as slave
6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as master
6.7 Static test cases
7 EPL 24 V LIN devices with RX and TX access
7.1 Test specification overview
7.1.1 Test case organization
7.1.2 Measurement and signal generation — Requirements
7.2 Operational conditions — Calibration
7.2.1 Electrical input/output, LIN protocol
7.2.2 [EPL–CT 51] Operating voltage range
7.2.3 Threshold voltages
7.2.4 [EPL–CT 55] Variation of VSUP_NON_OP
7.2.5 IBUS under several conditions
7.2.6 Slope control
7.2.7 Propagation delay
7.2.8 Supply voltage offset
7.2.9 Failure
7.2.10 [EPL–CT 80] Verifying internal capacitance and dynamic interference — IUT as slave
7.3 Operation mode termination
7.3.1 General
7.3.2 [EPL–CT 81] Measuring internal resistor — IUT as slave
7.3.3 [EPL–CT 82] Measuring internal resistor — IUT as master
7.4 Static test cases
8 EPL 24 V LIN devices without RX and TX access
8.1 Test specification overview
8.2 Communication scheme
8.2.1 Overview
8.2.2 IUT as slave
8.2.3 IUT as master
8.2.4 IUT Class C device
8.3 Test case organization
8.4 Measurement and signal generation — Requirements
8.4.1 Data generation
8.4.2 Various requirements
8.5 Operational conditions — Calibration
8.5.1 Electrical input/output, LIN protocol
8.5.2 [EPL–CT 83] Operating voltage range
8.5.3 Threshold voltages
8.5.4 [EPL–CT 87] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 58 V]
8.5.5 IBUS under several conditions
8.5.6 Slope control
8.5.7 [EPL–CT 93] Propagation delay
8.5.8 Supply voltage offset
8.5.9 Failure
8.5.10 [EPL–CT 106] Verifying internal capacitance and dynamic interference — IUT as slave
8.6 Operation mode termination
8.6.1 General
8.6.2 [EPL–CT 107] Measuring internal resistor — IUT as slave
8.6.3 [EPL–CT 108] Measuring internal resistor — IUT as master
8.7 Static test cases
Bibliography
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
3.2 Symbols
3.3 Abbreviated terms
4 Conventions
5 EPL 12 V LIN devices with RX and TX access
5.1 Test specification overview
5.1.1 Test case organization
5.1.2 Measurement and signal generation requirements
5.2 Operational conditions — Calibration
5.2.1 Electrical input/output, LIN protocol
5.2.2 [EPL–CT 1] Operating voltage range
5.2.3 Threshold voltages
5.2.4 [EPL–CT 5] Variation of VSUP_NON_OP
5.2.5 IBUS under several conditions
5.2.6 Slope control
5.2.7 Propagation delay
5.2.8 Supply voltage offset
5.2.9 Failure
5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference — IUT as slave
5.3 Operation mode termination
5.3.1 General
5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as slave
5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as master
5.4 Static test cases
6 EPL 12 V LIN devices without RX and TX access
6.1 Test specification overview
6.2 Communication scheme
6.2.1 General
6.2.2 IUT as slave
6.2.3 IUT as master
6.2.4 IUT class C device
6.3 Test case organization
6.4 Measurement and signal generation — Requirements
6.4.1 Data generation
6.4.2 Various requirements
6.5 Operational conditions — Calibration
6.5.1 Electrical input/output, LIN protocol
6.5.2 [EPL–CT 25] Operating voltage range
6.5.3 Threshold voltages
6.5.4 [EPL–CT 29] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 40 V]
6.5.5 IBUS under several conditions
6.5.6 Slope control
6.5.7 [EPL–CT 35] Propagation delay
6.5.8 Supply voltage offset
6.5.9 Failure
6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference — IUT as slave
6.6 Operation mode termination
6.6.1 General
6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as slave
6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as master
6.7 Static test cases
7 EPL 24 V LIN devices with RX and TX access
7.1 Test specification overview
7.1.1 Test case organization
7.1.2 Measurement and signal generation — Requirements
7.2 Operational conditions — Calibration
7.2.1 Electrical input/output, LIN protocol
7.2.2 [EPL–CT 51] Operating voltage range
7.2.3 Threshold voltages
7.2.4 [EPL–CT 55] Variation of VSUP_NON_OP
7.2.5 IBUS under several conditions
7.2.6 Slope control
7.2.7 Propagation delay
7.2.8 Supply voltage offset
7.2.9 Failure
7.2.10 [EPL–CT 80] Verifying internal capacitance and dynamic interference — IUT as slave
7.3 Operation mode termination
7.3.1 General
7.3.2 [EPL–CT 81] Measuring internal resistor — IUT as slave
7.3.3 [EPL–CT 82] Measuring internal resistor — IUT as master
7.4 Static test cases
8 EPL 24 V LIN devices without RX and TX access
8.1 Test specification overview
8.2 Communication scheme
8.2.1 Overview
8.2.2 IUT as slave
8.2.3 IUT as master
8.2.4 IUT Class C device
8.3 Test case organization
8.4 Measurement and signal generation — Requirements
8.4.1 Data generation
8.4.2 Various requirements
8.5 Operational conditions — Calibration
8.5.1 Electrical input/output, LIN protocol
8.5.2 [EPL–CT 83] Operating voltage range
8.5.3 Threshold voltages
8.5.4 [EPL–CT 87] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 58 V]
8.5.5 IBUS under several conditions
8.5.6 Slope control
8.5.7 [EPL–CT 93] Propagation delay
8.5.8 Supply voltage offset
8.5.9 Failure
8.5.10 [EPL–CT 106] Verifying internal capacitance and dynamic interference — IUT as slave
8.6 Operation mode termination
8.6.1 General
8.6.2 [EPL–CT 107] Measuring internal resistor — IUT as slave
8.6.3 [EPL–CT 108] Measuring internal resistor — IUT as master
8.7 Static test cases
Bibliography