BS 6493-3:1985
Withdrawn
Date published:
Semiconductor devices, Mechanical and climatic test methods
Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.
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Related Information
31.080.01 Semiconductor devices in general
31.200 Integrated circuits. Microelectronics
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BS 6493-3:1985
Get this standard
Prices exclude GST
PDF
( Single user document)
$498.26 NZD
PDF
( Single user document)
$0.00 NZD
HardCopy
$539.13 NZD