ISO/TR 24119:2015
Safety of machinery — Evaluation of fault masking serial connection of interlocking devices associated with guards with potential free contacts
ISO/TR 24119:2015 illustrates and explains principles of fault masking in applications where multiple interlocking devices with potential free contacts (B1 to Bn) are connected in series to one logic unit (K) which does the diagnostics (see Figures 1 to 7). It further provides a guide how to estimate the probability of fault masking and the maximum DC for the involved interlocking devices. This Technical Report only covers interlocking devices in which both channels are physical serial connections.
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Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Fault masking
4.1 General
4.2 Direct fault masking
4.3 Unintended reset of the fault
4.4 Cable fault with unintended reset
5 Methodology for evaluation of DC for series connected interlocking devices
6 Limitation of DC by effects of series connected devices
6.1 General
6.2 Simplified method for the determination of the maximum achievable DC
6.3 Regular method for the determination of the maximum achievable DC
6.3.1 Estimation of the fault masking probability
6.3.2 Determination of the maximum achievable DC
6.4 Interlocking devices with potential free contacts and other potential free contacts of devices with different functionality connected in series
7 Avoiding fault masking
Annex A (informative) Examples of the application of the evaluation methods described in 6.2 and 6.3
Bibliography
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Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Fault masking
4.1 General
4.2 Direct fault masking
4.3 Unintended reset of the fault
4.4 Cable fault with unintended reset
5 Methodology for evaluation of DC for series connected interlocking devices
6 Limitation of DC by effects of series connected devices
6.1 General
6.2 Simplified method for the determination of the maximum achievable DC
6.3 Regular method for the determination of the maximum achievable DC
6.3.1 Estimation of the fault masking probability
6.3.2 Determination of the maximum achievable DC
6.4 Interlocking devices with potential free contacts and other potential free contacts of devices with different functionality connected in series
7 Avoiding fault masking
Annex A (informative) Examples of the application of the evaluation methods described in 6.2 and 6.3
Bibliography