ISO 12179:2021
Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
4.2 Calibration of a configuration
4.3 Place of calibration
4.4 Defects
5 Measurement standards
6 Contact (stylus) instrument metrological characteristics
6.1 General
6.2 Residual profile calibration
6.3 Vertical profile component calibration
6.4 Horizontal profile component calibration
6.5 Profile coordinate system calibration
6.6 Total contact (stylus) instrument calibration
7 Calibration
7.1 Preparation for calibration
7.2 Evaluation of the residual profile
7.3 Calibration of the vertical profile component
7.3.1 Overall objective
7.3.2 Procedure
7.4 Calibration of the horizontal profile component
7.4.1 Overall objective
7.4.2 Procedure
7.5 Calibration of the profile coordinate system
7.5.1 Overall objective
7.5.2 Procedure
7.6 Calibration of the total contact (stylus) instrument
7.6.1 Overall objective
7.6.2 Procedure
7.7 Other calibrations
8 Measurement uncertainty
8.1 Information from the calibration certificate for a measurement standard
8.2 The uncertainty of the values measured during calibration of a measuring instrument using a measurement standard
9 Contact (stylus) instrument calibration certificate
10 General information
Annex A (normative) Calibration of instruments measuring parameters of the motifs method
Annex B (normative) Calibration of simplified operator instruments for the measurements of surface texture
Annex C (informative) Example: roughness measurement standard parameter Ra
Annex D (informative) Concept diagram
Annex E (informative) Overview of profile and areal standards in the GPS matrix model
Annex F (informative) Relation to the GPS matrix model
Bibliography
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
4.2 Calibration of a configuration
4.3 Place of calibration
4.4 Defects
5 Measurement standards
6 Contact (stylus) instrument metrological characteristics
6.1 General
6.2 Residual profile calibration
6.3 Vertical profile component calibration
6.4 Horizontal profile component calibration
6.5 Profile coordinate system calibration
6.6 Total contact (stylus) instrument calibration
7 Calibration
7.1 Preparation for calibration
7.2 Evaluation of the residual profile
7.3 Calibration of the vertical profile component
7.3.1 Overall objective
7.3.2 Procedure
7.4 Calibration of the horizontal profile component
7.4.1 Overall objective
7.4.2 Procedure
7.5 Calibration of the profile coordinate system
7.5.1 Overall objective
7.5.2 Procedure
7.6 Calibration of the total contact (stylus) instrument
7.6.1 Overall objective
7.6.2 Procedure
7.7 Other calibrations
8 Measurement uncertainty
8.1 Information from the calibration certificate for a measurement standard
8.2 The uncertainty of the values measured during calibration of a measuring instrument using a measurement standard
9 Contact (stylus) instrument calibration certificate
10 General information
Annex A (normative) Calibration of instruments measuring parameters of the motifs method
Annex B (normative) Calibration of simplified operator instruments for the measurements of surface texture
Annex C (informative) Example: roughness measurement standard parameter Ra
Annex D (informative) Concept diagram
Annex E (informative) Overview of profile and areal standards in the GPS matrix model
Annex F (informative) Relation to the GPS matrix model
Bibliography