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IEC TS 61945:2000

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Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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Pages: 23

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Pages: 23

IEC TS 61945:2000

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