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BS IEC 60747-8-4:2004

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Discrete semiconductor devices, Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications

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Pages: 64

Related Information

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  • BS EN 120003:1993

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

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  • BS EN 62373:2006

    Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

  • BS EN 62416:2010

    Semiconductor devices. Hot carrier test on MOS transistors

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Pages: 64

BS IEC 60747-8-4:2004

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PDF ( Single user document)
$535.46 NZD
HardCopy
$535.46 NZD

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