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BS EN 62416:2010

Current Date published:

Semiconductor devices. Hot carrier test on MOS transistors

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Pages: 14

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  • BS EN 62373:2006

    Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

  • BS EN 62417:2010

    Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Pages: 14