Skip to main content

BS 9364:1973

Date published:

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors

NOTE: The hard copy of this product is purchased from overseas and will take longer than usual to deliver

Lists the ratings, characteristics, inspection requirements and supplementary information to be included as minimum mandatory requirements in any detail specifications for switching transistors.

Get this standard Prices exclude GST
HardCopy
$395.60 NZD
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 0

Related Information

Similar Standards

  • BS EN 120003:1993

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

  • BS EN 120004:1993

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output

  • BS EN 62373:2006

    Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

  • BS EN 62416:2010

    Semiconductor devices. Hot carrier test on MOS transistors

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 0

BS 9364:1973

Get this standard Prices exclude GST
HardCopy
$395.60 NZD

Request to add this standard to your subscription

BS 9364:1973

Price varies
Online library subscription

Click "Send request for subscription" to ask your Account Administrator to add this standard to your subscripiton.

Cancel