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BS 9300:1969

Withdrawn Date published:

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Specification for semiconductor devices of assessed quality: generic data and methods of test

Forms part of the system of standards for electronic components of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for semiconductor devices. Included in section 2 are the general rules for preparation of detail specifications. Appendix C gives the agreed procedure for the adoption of specifications in the CV7000 series into the BS 9000 system. See also PD 6460.

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Pages: 428

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BS 9300:1969

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