Skip to main content

BS 9307:1975

Withdrawn Date published:

Warning: Withdrawn Standard. This document has been withdrawn without replacement. You may wish to search for a more up to date equivalent.

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance diodes for tuning applications

Lists the ratings, characteristics, inspection requirements and supplementary information to be included as minimum mandatory information (according to the rules in section 2 of BS 9300).

Get this standard Prices exclude GST
PDF ( Single user document)
$239.76 NZD
HardCopy
$239.76 NZD
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 13

Related Information

Similar Standards

  • BS CECC 50008:1982

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes

  • BS CECC 50009:1982

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes

  • BS EN 60747-2:2016

    Semiconductor devices, Discrete devices. Rectifier diodes

  • BS EN 61643-321:2002

    Low voltage surge protective devices, Specifications for avalanche breakdown diode (ABD)

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 13

BS 9307:1975

Get this standard Prices exclude GST
PDF ( Single user document)
$239.76 NZD
HardCopy
$239.76 NZD

Request to add this standard to your subscription

BS 9307:1975

Price varies
Online library subscription

Click "Send request for subscription" to ask your Account Administrator to add this standard to your subscripiton.

Cancel