AS/NZS 61000.4.20:2023
Electromagnetic compatibility (EMC), Part 4.20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2022 (ED. 3.0) MOD)
Standard adopts and modifies IEC 6100- 4-20:2022, which focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (e.g., striplines and electromagnetic pulse simulators) and closed structures (e.g., TEM cells). These structures can be further classified as one‐port, two‐port or multi‐port TEM waveguides.
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AS/NZS 61000.4.20:2023 Electromagnetic compatibility (EMC) Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2022 (ED. 3.0) MOD)
English
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
4 General
5 TEM waveguide requirements
5.1 General
5.2 General requirements for the use of TEM waveguides
5.2.1 Test volume and maximum EUT size
5.2.2 Validation of usable test volume
5.3 Special requirements and recommendations for certain types of TEM waveguides
5.3.1 Set-up of open TEM waveguides
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide
5.3.3 TEM mode generation for a four-port TEM waveguide
5.4 Figures for Clause 5
6 Overview of EUT types
6.1 General
6.2 Small EUT
6.3 Large EUT
7 Laboratory test conditions
7.1 General
7.2 Climatic conditions
7.3 Electromagnetic conditions
8 Evaluation and reporting of test results
Annex€A (normative)Emission measurements in TEM waveguides
A.1 Overview
A.2 Test equipment
A.3 Correlating TEM waveguide voltages to electric field strength data
A.3.1 General
A.3.2 Correlation algorithms
A.4 Emission measurement correction factors
A.4.1 Reference emission sources
A.4.2 Arrangement of small EUTs
A.4.3 Calculation of the small EUT correction factor
A.5 Emission measurement procedures in TEM waveguides
A.5.1 EUT types
A.5.2 EUT arrangement
A.6 Test report
A.7 Figures for Annex€A
Annex€B (normative)Immunity testing in TEM waveguides
B.1 Overview
B.2 Test equipment
B.2.1 General
B.2.2 Description of the test facility
B.3 Field uniformity area calibration
B.4 Test levels
B.5 Test set-up
B.5.1 Arrangement of table-top equipment
B.5.2 Arrangement of floor-standing equipment
B.5.3 Arrangement of wiring
B.6 Test procedures
B.7 Test results and test report
B.8 Figures for Annex€B
Annex€C (normative)HEMP transient testing in TEM waveguides
C.1 Overview
C.2 Immunity tests
C.2.1 General
C.2.2 Radiated test facilities
C.2.3 Frequency domain spectrum requirements
C.3 Test equipment
C.4 Test set-up
C.5 Test procedure
C.5.1 General
C.5.2 Severity level and test exposures
C.5.3 Test procedure
C.5.4 Test execution
C.5.5 Execution of the radiated immunity test
C.6 Figure for Annex€C
Annex€D (informative)TEM waveguide characterization
D.1 Overview
D.2 Distinction between wave impedance and characteristic impedance
D.3 TEM wave
D.3.1 General
D.3.2 Free-space TEM mode
D.3.3 Waveguides
D.4 Wave propagation
D.4.1 General
D.4.2 Spherical propagation
D.4.3 Plane wave propagation in free space
D.4.4 Velocity of propagation
D.5 Polarization
D.6 Types of TEM waveguides
D.6.1 General
D.6.2 Open TEM waveguides (striplines, etc.)
D.6.3 Closed TEM waveguides (TEM cells)
D.7 Frequency limitations
D.8 Figures for Annex€D
Annex€E (informative)Calibration method for E-field probes in TEM waveguides
E.1 Overview
E.2 Probe calibration requirements
E.2.1 General
E.2.2 Calibration frequency range
E.2.3 Calibration volume
E.2.4 Probe dimensions
E.2.5 Perturbations of TEM waveguide fields due to the probe
E.2.6 Frequency steps
E.2.7 Field strength
E.3 Requirements for calibration instrumentation
E.3.1 Specifications of TEM waveguide
E.3.2 Harmonics and spurious signals
E.3.3 Probe fixture
E.3.4 Measuring net power to a transmitting device using directional couplers
E.4 E-field probe calibration
E.4.1 Calibration methods
E.4.2 Calibration procedure using a two-port TEM waveguide
E.4.3 Calibration procedure using one-port TEM waveguide
E.5 Figures for Annex€E
Annex€F (informative)Instrumentation uncertainty of emission measurement results
F.1 Radiated disturbance measurements using a TEM waveguide
F.1.1 Measurand for radiated disturbance measurements using a TEM waveguide
F.1.2 Symbols of input quantities common to all disturbance measurements
F.1.3 Symbols of input quantities specific to TEM waveguide measurements
F.2 Input quantities to be considered for radiated disturbance measurements using a TEM waveguide
F.3 Uncertainty budget and rationale for the input quantities for radiated disturbance measurements using a TEM waveguide
F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM waveguide
F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide
F.4 Figures for Annex€F
Annex€G (informative)Measurement uncertainty of immunity testingdue to test instrumentation
G.1 General symbols
G.2 Symbol and definition of the measurand
G.3 Symbols for input quantities
G.4 Example: Uncertainty budget for immunity test
G.5 Rationale for the estimates of input quantities
Annex€H (informative)Correlation of emission and immunity limitsbetween EMC test facilities
H.1 Overview
H.2 Dipole in free space (representing FAR set-up)
H.3 Dipole in half space (representing OATS or SAC set-up)
H.4 Dipole in a TEM-mode transmission line
H.5 Dipole in a reverberation chamber
H.6 Correlation
H.7 Example of emission limits
H.8 Figures for Annex€H
Annex€I (informative)TEM waveguide transient characterization
I.1 Overview
I.2 Test equipment
I.3 Test set-up
I.4 TEM waveguide characterization by correlation
I.5 Quantification of the Pcc
I.6 Performable transient test signals
I.7 Figures for Annex€I
Bibliography
Figures
Figure 1 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant forward power” method (see 5.2.2.4.1)
Figure 2 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant field strength” method (see 5.2.2.4.2)
Figure A.1 – Routing the exit cable to the corner at the ortho-angleand the lower edge of the test volume in a TEM waveguide (see A.5.2)
Figure A.2 – Basic ortho-axis EUT positioner or manipulator(see 3.1.13, A.4.2, A.5.1.2, A.5.2)
Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2)
Figure A.4 – Non-redundant twelve-face and axis orientationsfor a typical EUT [26] (see A.3.2.3.2)
Figure A.5 – Open-area test site (OATS) emission measurements geometry (see A.3.2.4)
Figure B.1 – Example of test set-up for single-polarization TEM waveguide(see€Clause€B.5)
Figure€B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3)
Figure C.1 – Pulse waveform frequency domain spectral magnitudebetween 100€kHz and 300€MHz (see C.2.1)
Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3)
Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3)
Figure D.3 – E-field polarization vector (see Clause D.5)
Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1)
Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1)
Figure D.6 – Operation of four-port TEM waveguides (see D.6.1)
Figure€D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3)
Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3)
Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2)
Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1)
Figure€D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and D.6.3)
Figure E.1 – Example of test points for calibration volume validation (see E.2.3)
Figure E.2 – Set-up for validation of probe perturbation (see E.2.5)
Figure E.3 – Set-up for measuring net power toa transmitting device (not to scale) (see E.3.4)
Figure E.4 – Example set-up for E-field probecalibration with two-port TEM waveguide (see E.4.2)
Figure E.5 – Example set-up for E-field probe calibration withone-port TEM waveguide and alternative method (see E.4.3.2)
Figure E.6 – Equivalent circuit of monopole antennaand measuring apparatus (see E.4.3.3)
Figure F.1 – Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100€Hz
Figure F.2 – Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
Figure H.1 – Representation of a short centre-fed dipole anda more general source representing an EUT (see Clause H.2)
Figure H.2 – Vertical source and receiving dipoles located overa perfectly-conducting ground plane of infinite extent (see Clause H.3)
Figure H.3 – Two types of TEM cells with a vertically polarized dipole sourceand the source to receive port geometry defined (see Clause H.4)
Figure H.4 – Reverberation chamber with a source dipole, a stirrer torandomize the fields, and a general receive antenna (see Clause H.5)
Figure H.5 – TEM waveguide Class A and Class B emission limits correlatedfrom CISPR€32 [68] (see Clause H.7)
Figure I.1 – Test set-up
Figure I.2 – Signal windowing
Figure I.3 – Example of a heatmap – Pcc for a test point in the uniform area
Tables
Table 1 – Values k for expanded uncertainty with normal distribution
Table B.1 – Uniform area calibration points
Table B.2 – Test levels
Table C.1 – Radiated immunity test levels definedfor this document
Table E.1 – Calibration frequencies
Table E.2 – Calibration field strength level
Table F.1 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 30€MHz to 1€000€MHz (example)
Table F.2 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 1€GHz to 6€GHz (example)
Table F.3 – Values of Slim for 30€MHz to 1€000€MHz
Table F.4 – Values of Slim for 1€GHz to 6€GHz
Table G.1 – Example uncertainty budget of the immunity test level
Table€H.1 – Summary of the emission correlation parameters
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AS/NZS 61000.4.20:2023 Electromagnetic compatibility (EMC) Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2022 (ED. 3.0) MOD)
English
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
4 General
5 TEM waveguide requirements
5.1 General
5.2 General requirements for the use of TEM waveguides
5.2.1 Test volume and maximum EUT size
5.2.2 Validation of usable test volume
5.3 Special requirements and recommendations for certain types of TEM waveguides
5.3.1 Set-up of open TEM waveguides
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide
5.3.3 TEM mode generation for a four-port TEM waveguide
5.4 Figures for Clause 5
6 Overview of EUT types
6.1 General
6.2 Small EUT
6.3 Large EUT
7 Laboratory test conditions
7.1 General
7.2 Climatic conditions
7.3 Electromagnetic conditions
8 Evaluation and reporting of test results
Annex€A (normative)Emission measurements in TEM waveguides
A.1 Overview
A.2 Test equipment
A.3 Correlating TEM waveguide voltages to electric field strength data
A.3.1 General
A.3.2 Correlation algorithms
A.4 Emission measurement correction factors
A.4.1 Reference emission sources
A.4.2 Arrangement of small EUTs
A.4.3 Calculation of the small EUT correction factor
A.5 Emission measurement procedures in TEM waveguides
A.5.1 EUT types
A.5.2 EUT arrangement
A.6 Test report
A.7 Figures for Annex€A
Annex€B (normative)Immunity testing in TEM waveguides
B.1 Overview
B.2 Test equipment
B.2.1 General
B.2.2 Description of the test facility
B.3 Field uniformity area calibration
B.4 Test levels
B.5 Test set-up
B.5.1 Arrangement of table-top equipment
B.5.2 Arrangement of floor-standing equipment
B.5.3 Arrangement of wiring
B.6 Test procedures
B.7 Test results and test report
B.8 Figures for Annex€B
Annex€C (normative)HEMP transient testing in TEM waveguides
C.1 Overview
C.2 Immunity tests
C.2.1 General
C.2.2 Radiated test facilities
C.2.3 Frequency domain spectrum requirements
C.3 Test equipment
C.4 Test set-up
C.5 Test procedure
C.5.1 General
C.5.2 Severity level and test exposures
C.5.3 Test procedure
C.5.4 Test execution
C.5.5 Execution of the radiated immunity test
C.6 Figure for Annex€C
Annex€D (informative)TEM waveguide characterization
D.1 Overview
D.2 Distinction between wave impedance and characteristic impedance
D.3 TEM wave
D.3.1 General
D.3.2 Free-space TEM mode
D.3.3 Waveguides
D.4 Wave propagation
D.4.1 General
D.4.2 Spherical propagation
D.4.3 Plane wave propagation in free space
D.4.4 Velocity of propagation
D.5 Polarization
D.6 Types of TEM waveguides
D.6.1 General
D.6.2 Open TEM waveguides (striplines, etc.)
D.6.3 Closed TEM waveguides (TEM cells)
D.7 Frequency limitations
D.8 Figures for Annex€D
Annex€E (informative)Calibration method for E-field probes in TEM waveguides
E.1 Overview
E.2 Probe calibration requirements
E.2.1 General
E.2.2 Calibration frequency range
E.2.3 Calibration volume
E.2.4 Probe dimensions
E.2.5 Perturbations of TEM waveguide fields due to the probe
E.2.6 Frequency steps
E.2.7 Field strength
E.3 Requirements for calibration instrumentation
E.3.1 Specifications of TEM waveguide
E.3.2 Harmonics and spurious signals
E.3.3 Probe fixture
E.3.4 Measuring net power to a transmitting device using directional couplers
E.4 E-field probe calibration
E.4.1 Calibration methods
E.4.2 Calibration procedure using a two-port TEM waveguide
E.4.3 Calibration procedure using one-port TEM waveguide
E.5 Figures for Annex€E
Annex€F (informative)Instrumentation uncertainty of emission measurement results
F.1 Radiated disturbance measurements using a TEM waveguide
F.1.1 Measurand for radiated disturbance measurements using a TEM waveguide
F.1.2 Symbols of input quantities common to all disturbance measurements
F.1.3 Symbols of input quantities specific to TEM waveguide measurements
F.2 Input quantities to be considered for radiated disturbance measurements using a TEM waveguide
F.3 Uncertainty budget and rationale for the input quantities for radiated disturbance measurements using a TEM waveguide
F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM waveguide
F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide
F.4 Figures for Annex€F
Annex€G (informative)Measurement uncertainty of immunity testingdue to test instrumentation
G.1 General symbols
G.2 Symbol and definition of the measurand
G.3 Symbols for input quantities
G.4 Example: Uncertainty budget for immunity test
G.5 Rationale for the estimates of input quantities
Annex€H (informative)Correlation of emission and immunity limitsbetween EMC test facilities
H.1 Overview
H.2 Dipole in free space (representing FAR set-up)
H.3 Dipole in half space (representing OATS or SAC set-up)
H.4 Dipole in a TEM-mode transmission line
H.5 Dipole in a reverberation chamber
H.6 Correlation
H.7 Example of emission limits
H.8 Figures for Annex€H
Annex€I (informative)TEM waveguide transient characterization
I.1 Overview
I.2 Test equipment
I.3 Test set-up
I.4 TEM waveguide characterization by correlation
I.5 Quantification of the Pcc
I.6 Performable transient test signals
I.7 Figures for Annex€I
Bibliography
Figures
Figure 1 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant forward power” method (see 5.2.2.4.1)
Figure 2 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant field strength” method (see 5.2.2.4.2)
Figure A.1 – Routing the exit cable to the corner at the ortho-angleand the lower edge of the test volume in a TEM waveguide (see A.5.2)
Figure A.2 – Basic ortho-axis EUT positioner or manipulator(see 3.1.13, A.4.2, A.5.1.2, A.5.2)
Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2)
Figure A.4 – Non-redundant twelve-face and axis orientationsfor a typical EUT [26] (see A.3.2.3.2)
Figure A.5 – Open-area test site (OATS) emission measurements geometry (see A.3.2.4)
Figure B.1 – Example of test set-up for single-polarization TEM waveguide(see€Clause€B.5)
Figure€B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3)
Figure C.1 – Pulse waveform frequency domain spectral magnitudebetween 100€kHz and 300€MHz (see C.2.1)
Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3)
Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3)
Figure D.3 – E-field polarization vector (see Clause D.5)
Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1)
Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1)
Figure D.6 – Operation of four-port TEM waveguides (see D.6.1)
Figure€D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3)
Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3)
Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2)
Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1)
Figure€D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and D.6.3)
Figure E.1 – Example of test points for calibration volume validation (see E.2.3)
Figure E.2 – Set-up for validation of probe perturbation (see E.2.5)
Figure E.3 – Set-up for measuring net power toa transmitting device (not to scale) (see E.3.4)
Figure E.4 – Example set-up for E-field probecalibration with two-port TEM waveguide (see E.4.2)
Figure E.5 – Example set-up for E-field probe calibration withone-port TEM waveguide and alternative method (see E.4.3.2)
Figure E.6 – Equivalent circuit of monopole antennaand measuring apparatus (see E.4.3.3)
Figure F.1 – Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100€Hz
Figure F.2 – Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
Figure H.1 – Representation of a short centre-fed dipole anda more general source representing an EUT (see Clause H.2)
Figure H.2 – Vertical source and receiving dipoles located overa perfectly-conducting ground plane of infinite extent (see Clause H.3)
Figure H.3 – Two types of TEM cells with a vertically polarized dipole sourceand the source to receive port geometry defined (see Clause H.4)
Figure H.4 – Reverberation chamber with a source dipole, a stirrer torandomize the fields, and a general receive antenna (see Clause H.5)
Figure H.5 – TEM waveguide Class A and Class B emission limits correlatedfrom CISPR€32 [68] (see Clause H.7)
Figure I.1 – Test set-up
Figure I.2 – Signal windowing
Figure I.3 – Example of a heatmap – Pcc for a test point in the uniform area
Tables
Table 1 – Values k for expanded uncertainty with normal distribution
Table B.1 – Uniform area calibration points
Table B.2 – Test levels
Table C.1 – Radiated immunity test levels definedfor this document
Table E.1 – Calibration frequencies
Table E.2 – Calibration field strength level
Table F.1 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 30€MHz to 1€000€MHz (example)
Table F.2 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 1€GHz to 6€GHz (example)
Table F.3 – Values of Slim for 30€MHz to 1€000€MHz
Table F.4 – Values of Slim for 1€GHz to 6€GHz
Table G.1 – Example uncertainty budget of the immunity test level
Table€H.1 – Summary of the emission correlation parameters
AS/NZS 61000.4.20:2023
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The cost of your subscription will depend on which standards you want to access, and how many people in your organisation need to be able to access the Online Library subscription at the same time (concurrent users). During your subscription period, we are also able to make any necessary changes and ensure you are aware of any pricing changes that result. For a quote, contact our Online Library team by emailing onlinelibrary@standards.govt.nz.