ISO 19683:2017
Space systems — Design qualification and acceptance tests of small spacecraft and units
ISO 19683:2017 provides test methods and test requirements for design qualification and/or acceptance of small spacecraft or units. It provides the minimum test requirements and test methods to qualify the design and manufacturing methods of commercial small spacecraft and their units and to accept the final products.
ISO 19683:2017 places emphasis on achieving reliability against infant mortality after satellite launch to orbit while maintaining low cost and fast delivery.
ISO 19683:2017 is applied to satellites whose development methods are different from the ones used for traditional satellites that have little room for risk tolerance, as shown in Figure 1. The scope of this document encompasses different categories of small spacecraft, so-called mini-, micro, nano-, pico- and femto-, as well as CubeSat, spacecraft. Therefore, for the sake of convenience, the term "small spacecraft" is used throughout this document as a generic term.
ISO 19683:2017 includes CubeSat, as long as it is developed with the untraditional processes.
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 General requirements
5.1 Tailoring
5.2 Qualification test
5.3 Acceptance test
5.4 Proto-flight test
5.5 Retest
5.6 Test documentation
5.6.1 Test plan, specification and procedure
5.6.2 Test report
5.6.3 Datasheet for unit test results
5.7 Test conditions, tolerances and accuracies
5.8 Functional test
5.9 Design, verification and testing philosophy
6 Satellite system tests
6.1 Test items
6.2 Test level and duration
7 Unit tests
7.1 Test items
7.2 Test levels and duration
8 Test requirements
8.1 Electrical interface
8.1.1 Purpose of test
8.1.2 Test facilities and setup as basic requirements
8.1.3 Test article configuration
8.1.4 Monitoring during test
8.1.5 Test levels and duration
8.1.6 Test conditions and guidelines
8.2 Functional test
8.2.1 Purpose of test
8.2.2 Test facilities and setup as basic requirements
8.2.3 Test article configuration
8.2.4 Monitoring during test
8.2.5 Test levels and duration
8.2.6 Test conditions and guidelines
8.3 Mission test
8.3.1 Purpose of test
8.3.2 Test facilities and setup as basic requirements
8.3.3 Test article configuration
8.3.4 Monitoring during test
8.3.5 Test levels and duration
8.3.6 Test conditions and guidelines
8.4 Total Ionization Dose (TID) test
8.4.1 Purpose of test
8.4.2 Test facilities and setup as basic requirements
8.4.3 Test article configuration
8.4.4 Monitoring during test
8.4.5 Test levels and duration
8.4.6 Test conditions and guidelines
8.5 Single Event Effect (SEE) test
8.5.1 Purpose of test
8.5.2 Test facilities and setup as basic requirements
8.5.3 Test article configuration
8.5.4 Monitoring during test
8.5.5 Test levels and duration
8.5.6 Test conditions and guidelines
8.5.7 Test conditions and guidelines
8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test
8.6.1 Purpose of test
8.6.2 Test facilities and setup as basic requirements
8.6.3 Test article configuration
8.6.4 Monitoring during test
8.6.5 Test levels and duration
8.6.6 Test conditions and guidelines
8.7 Electromagnetic Compatibility (EMC) test
8.7.1 Purpose of test
8.7.2 Test facilities and setup as basic requirements
8.7.3 Test article configuration
8.7.4 Monitoring during test
8.7.5 Test levels and duration
8.7.6 Test conditions and guidelines
8.8 Deployment test
8.8.1 Purpose of test
8.8.2 Test facilities and setup as basic requirements
8.8.3 Test article configuration
8.8.4 Monitoring during test
8.8.5 Test levels and duration
8.8.6 Test conditions and guidelines
8.9 Magnetic field test
8.10 Antenna pattern test
8.11 Alignment measurement
8.12 Physical property measurement
8.13 Launcher/Spacecraft interface test
8.14 Quasi-static load test
8.14.1 Purpose of test
8.14.2 Test facilities and setup as basic requirements
8.14.3 Test article configuration
8.14.4 Monitoring during test
8.14.5 Test levels and duration
8.14.6 Test conditions and guidelines
8.15 Modal survey
8.15.1 Purpose of test
8.15.2 Test facilities and setup as basic requirements
8.15.3 Test article configuration
8.15.4 Monitoring during test
8.15.5 Test levels and duration
8.15.6 Test conditions and guidelines
8.16 Sinusoidal vibration test
8.16.1 Purpose of test
8.16.2 Test facilities and setup as basic requirements
8.16.3 Test article configuration
8.16.4 Monitoring during test
8.16.5 Test levels and duration
8.16.6 Test conditions and guidelines
8.17 Random vibration test
8.17.1 Purpose of test
8.17.2 Test facilities and setup as basic requirements
8.17.3 Test article configuration
8.17.4 Monitoring during test
8.17.5 Test levels and duration
8.17.6 Test conditions and guidelines
8.18 Acoustic test
8.18.1 Purpose of test
8.18.2 Test facilities and setup as basic requirements
8.18.3 Test article configuration
8.18.4 Monitoring during test
8.18.5 Test levels and duration
8.18.6 Test conditions and guidelines
8.19 Shock test
8.19.1 Purpose of test
8.19.2 Test facilities and setup as basic requirements
8.19.3 Test article configuration
8.19.4 Monitoring during test
8.19.5 Test levels and duration
8.19.6 Test conditions and guidelines
8.20 Thermal balance test
8.20.1 Purpose of test
8.20.2 Test facilities and setup as basic requirements
8.20.3 Test article configuration
8.20.4 Monitoring during test
8.20.5 Test levels and duration
8.20.6 Test conditions and guidelines
8.21 Thermal vacuum test
8.21.1 Purpose of test
8.21.2 Test facilities and setup as basic requirements
8.21.3 Test article configuration
8.21.4 Monitoring during test
8.21.5 Test levels and duration
8.21.6 Test conditions and guidelines
8.22 Functional test in vacuum
8.22.1 Purpose of test
8.22.2 Test facilities and setup as basic requirements
8.22.3 Test article configuration
8.22.4 Monitoring during test
8.22.5 Test levels and duration
8.22.6 Test conditions and guidelines
8.23 Cold/Hot start test
8.23.1 Purpose of test
8.23.2 Test facilities and setup as basic requirements
8.23.3 Test article configuration
8.23.4 Monitoring during test
8.23.5 Test levels and duration
8.23.6 Test conditions and guidelines
8.24 Thermal cycle functional test
8.24.1 Purpose of test
8.24.2 Test facilities and setup as basic requirements
8.24.3 Test article configuration
8.24.4 Monitoring during test
8.24.5 Test levels and duration
8.24.6 Test conditions and guidelines
8.25 Thermal cycle endurance test
8.25.1 Purpose of test
8.25.2 Test facilities and setup as basic requirements
8.25.3 Test article configuration
8.25.4 Monitoring during test
8.25.5 Test levels and duration
8.25.6 Test conditions and guidelines
8.26 Pressure test
8.27 Leakage test
8.28 Microvibration test
8.28.1 Purpose of test
8.28.2 Test facilities and setup as basic requirements
8.28.3 Test article configuration
8.28.4 Monitoring during test
8.28.5 Test levels and duration
8.28.6 Test conditions and guidelines
8.29 Burn-in and wear-in test
8.30 End-to-end mission simulation
8.30.1 Purpose of test
8.30.2 Test facilities and setup as basic requirements
8.30.3 Test article configuration
8.30.4 Monitoring during test
8.30.5 Test levels and duration
8.30.6 Test conditions and guidelines
8.31 Bake out and outgas test
8.31.1 Purpose of test
8.31.2 Test facilities and setup as basic requirements
8.31.3 Test article configuration
8.31.4 Monitoring during test
8.31.5 Test levels and duration
8.31.6 Test conditions and guidelines
8.32 Tailoring and waiver guides
Annex A (normative) Tailoring and waiver guides
Annex B (informative) Basis of test levels and duration
Annex C (informative) Design, verification and testing philosophy for small spacecrafts
Annex D (informative) Test selection logic flow
Annex E (informative) Environment stress screening and burn-in
Annex F (informative) Thermal vacuum or thermal cycle?
Bibliography
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 General requirements
5.1 Tailoring
5.2 Qualification test
5.3 Acceptance test
5.4 Proto-flight test
5.5 Retest
5.6 Test documentation
5.6.1 Test plan, specification and procedure
5.6.2 Test report
5.6.3 Datasheet for unit test results
5.7 Test conditions, tolerances and accuracies
5.8 Functional test
5.9 Design, verification and testing philosophy
6 Satellite system tests
6.1 Test items
6.2 Test level and duration
7 Unit tests
7.1 Test items
7.2 Test levels and duration
8 Test requirements
8.1 Electrical interface
8.1.1 Purpose of test
8.1.2 Test facilities and setup as basic requirements
8.1.3 Test article configuration
8.1.4 Monitoring during test
8.1.5 Test levels and duration
8.1.6 Test conditions and guidelines
8.2 Functional test
8.2.1 Purpose of test
8.2.2 Test facilities and setup as basic requirements
8.2.3 Test article configuration
8.2.4 Monitoring during test
8.2.5 Test levels and duration
8.2.6 Test conditions and guidelines
8.3 Mission test
8.3.1 Purpose of test
8.3.2 Test facilities and setup as basic requirements
8.3.3 Test article configuration
8.3.4 Monitoring during test
8.3.5 Test levels and duration
8.3.6 Test conditions and guidelines
8.4 Total Ionization Dose (TID) test
8.4.1 Purpose of test
8.4.2 Test facilities and setup as basic requirements
8.4.3 Test article configuration
8.4.4 Monitoring during test
8.4.5 Test levels and duration
8.4.6 Test conditions and guidelines
8.5 Single Event Effect (SEE) test
8.5.1 Purpose of test
8.5.2 Test facilities and setup as basic requirements
8.5.3 Test article configuration
8.5.4 Monitoring during test
8.5.5 Test levels and duration
8.5.6 Test conditions and guidelines
8.5.7 Test conditions and guidelines
8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test
8.6.1 Purpose of test
8.6.2 Test facilities and setup as basic requirements
8.6.3 Test article configuration
8.6.4 Monitoring during test
8.6.5 Test levels and duration
8.6.6 Test conditions and guidelines
8.7 Electromagnetic Compatibility (EMC) test
8.7.1 Purpose of test
8.7.2 Test facilities and setup as basic requirements
8.7.3 Test article configuration
8.7.4 Monitoring during test
8.7.5 Test levels and duration
8.7.6 Test conditions and guidelines
8.8 Deployment test
8.8.1 Purpose of test
8.8.2 Test facilities and setup as basic requirements
8.8.3 Test article configuration
8.8.4 Monitoring during test
8.8.5 Test levels and duration
8.8.6 Test conditions and guidelines
8.9 Magnetic field test
8.10 Antenna pattern test
8.11 Alignment measurement
8.12 Physical property measurement
8.13 Launcher/Spacecraft interface test
8.14 Quasi-static load test
8.14.1 Purpose of test
8.14.2 Test facilities and setup as basic requirements
8.14.3 Test article configuration
8.14.4 Monitoring during test
8.14.5 Test levels and duration
8.14.6 Test conditions and guidelines
8.15 Modal survey
8.15.1 Purpose of test
8.15.2 Test facilities and setup as basic requirements
8.15.3 Test article configuration
8.15.4 Monitoring during test
8.15.5 Test levels and duration
8.15.6 Test conditions and guidelines
8.16 Sinusoidal vibration test
8.16.1 Purpose of test
8.16.2 Test facilities and setup as basic requirements
8.16.3 Test article configuration
8.16.4 Monitoring during test
8.16.5 Test levels and duration
8.16.6 Test conditions and guidelines
8.17 Random vibration test
8.17.1 Purpose of test
8.17.2 Test facilities and setup as basic requirements
8.17.3 Test article configuration
8.17.4 Monitoring during test
8.17.5 Test levels and duration
8.17.6 Test conditions and guidelines
8.18 Acoustic test
8.18.1 Purpose of test
8.18.2 Test facilities and setup as basic requirements
8.18.3 Test article configuration
8.18.4 Monitoring during test
8.18.5 Test levels and duration
8.18.6 Test conditions and guidelines
8.19 Shock test
8.19.1 Purpose of test
8.19.2 Test facilities and setup as basic requirements
8.19.3 Test article configuration
8.19.4 Monitoring during test
8.19.5 Test levels and duration
8.19.6 Test conditions and guidelines
8.20 Thermal balance test
8.20.1 Purpose of test
8.20.2 Test facilities and setup as basic requirements
8.20.3 Test article configuration
8.20.4 Monitoring during test
8.20.5 Test levels and duration
8.20.6 Test conditions and guidelines
8.21 Thermal vacuum test
8.21.1 Purpose of test
8.21.2 Test facilities and setup as basic requirements
8.21.3 Test article configuration
8.21.4 Monitoring during test
8.21.5 Test levels and duration
8.21.6 Test conditions and guidelines
8.22 Functional test in vacuum
8.22.1 Purpose of test
8.22.2 Test facilities and setup as basic requirements
8.22.3 Test article configuration
8.22.4 Monitoring during test
8.22.5 Test levels and duration
8.22.6 Test conditions and guidelines
8.23 Cold/Hot start test
8.23.1 Purpose of test
8.23.2 Test facilities and setup as basic requirements
8.23.3 Test article configuration
8.23.4 Monitoring during test
8.23.5 Test levels and duration
8.23.6 Test conditions and guidelines
8.24 Thermal cycle functional test
8.24.1 Purpose of test
8.24.2 Test facilities and setup as basic requirements
8.24.3 Test article configuration
8.24.4 Monitoring during test
8.24.5 Test levels and duration
8.24.6 Test conditions and guidelines
8.25 Thermal cycle endurance test
8.25.1 Purpose of test
8.25.2 Test facilities and setup as basic requirements
8.25.3 Test article configuration
8.25.4 Monitoring during test
8.25.5 Test levels and duration
8.25.6 Test conditions and guidelines
8.26 Pressure test
8.27 Leakage test
8.28 Microvibration test
8.28.1 Purpose of test
8.28.2 Test facilities and setup as basic requirements
8.28.3 Test article configuration
8.28.4 Monitoring during test
8.28.5 Test levels and duration
8.28.6 Test conditions and guidelines
8.29 Burn-in and wear-in test
8.30 End-to-end mission simulation
8.30.1 Purpose of test
8.30.2 Test facilities and setup as basic requirements
8.30.3 Test article configuration
8.30.4 Monitoring during test
8.30.5 Test levels and duration
8.30.6 Test conditions and guidelines
8.31 Bake out and outgas test
8.31.1 Purpose of test
8.31.2 Test facilities and setup as basic requirements
8.31.3 Test article configuration
8.31.4 Monitoring during test
8.31.5 Test levels and duration
8.31.6 Test conditions and guidelines
8.32 Tailoring and waiver guides
Annex A (normative) Tailoring and waiver guides
Annex B (informative) Basis of test levels and duration
Annex C (informative) Design, verification and testing philosophy for small spacecrafts
Annex D (informative) Test selection logic flow
Annex E (informative) Environment stress screening and burn-in
Annex F (informative) Thermal vacuum or thermal cycle?
Bibliography