Skip to main content

ISO 16700:2016

Current Date published:

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

Get this standard Prices exclude GST
PDF ( Single user document)
$179.13 NZD
HardCopy
$214.78 NZD
Networkable PDF
Price varies
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 18

Previous versions

Keep me up-to-date

Register to receive notifications when updates are made to this standard.

Related Information

Similar Standards

  • BS 4995:1973

    Recommendations for measurement of the veiling glare index of lenses and optical systems

  • BS 7011-0:1989

    Consumable accessories for light microscopes., General introduction

  • BS 7011-2.1:1989

    Consumable accessories for light microscopes. Slides., Specification for dimensions and optical properties

  • BS 7011-2.2:1998

    Consumable accessories for light microscopes. Slides, Specification for materials and quality of finish

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 18

Previous versions

ISO 16700:2016

Get this standard Prices exclude GST
PDF ( Single user document)
$179.13 NZD
HardCopy
$214.78 NZD
Networkable PDF
Price varies

Request to add this standard to your subscription

ISO 16700:2016

Price varies
Online library subscription

Click "Send request for subscription" to ask your Account Administrator to add this standard to your subscripiton.

Cancel