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IEC 60749-39:2006

Superseded Date published:

Warning: Superseded Standard. This document has been replaced by:

IEC 60749-39:2021 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

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Pages: 19

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IEC 60749-39:2006

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