BS IEC 60747-10:1991
Current
Date published:
Semiconductor devices, Generic specification for discrete devices and integrated circuits
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
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Related Information
31.080.01 Semiconductor devices in general
31.200 Integrated circuits. Microelectronics
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BS IEC 60747-10:1991
Get this standard
Prices exclude GST
PDF
( Single user document)
$473.91 NZD
HardCopy
$513.91 NZD