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BS EN 62416:2010

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Semiconductor devices. Hot carrier test on MOS transistors

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Related Information

Similar Standards

  • BS EN 120003:1993

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

  • BS EN 120004:1993

    Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output

  • BS EN 62373:2006

    Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

  • BS EN 62417:2010

    Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

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BS EN 62416:2010

Get this standard Prices exclude GST
PDF ( Single user document)
$257.39 NZD
PDF ( Single user document)
$239.76 NZD
HardCopy
$293.04 NZD

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