BS EN 62047-8:2011
Current
Date published:
Semiconductor devices. Micro-electromechanical devices, Strip bending test method for tensile property measurement of thin films
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$275.72 NZD
|
|
| HardCopy |
$275.72 NZD
|
|
Related Information
31.080.99 Other semiconductor devices
Similar Standards
-
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
-
BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
-
BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors, Self-commutated semiconductor converters including direct d.c. converters
-
BS EN 60464-2:2001
Varnishes used for electrical insulation, Methods of test
BS EN 62047-8:2011
Get this standard
Prices exclude GST
PDF
( Single user document)
$275.72 NZD
HardCopy
$275.72 NZD